X-Ray Residual Stress Diffractometer

X-Ray Diffraction (XRD) methods of stress measurement have been widely used in the last years, in automotive, in aerospace and in many other industrial applications.
Among the non-destructive methods, XRD is the most accurate and best developed: for this reason the interest in the use of XRD stress analysis for the control of the surface treatments is increasing.

No matter how big the sample is: ENIXE is small, compact and portable and ensures an accurate and quick analysis.
The control of the shot peening, for example, can easily obtained by measuring the subsurface residual stress distributions produced: few minutes of measurement are enough for determining the stress components in the desired point.

The user can move the instrument over the sample; the correct alignment is easily obtained thanks to laser beams; once the head of the goniometer is placed at the correct height the measurement starts and in few minutes the analysis allows the determination of the residual stress in the chosen point.The user can also select one or more measurement directions (! plane) in order to improve the quality of the achievable information. The X-ray spot on the sample can be changed replacing the collimator, according to the curvature and the grain size of the sample.
  • shot peening (gears, turbine blades, turbine discs and rotors, pinions, connecting rods, transmission shafts, wheels, equalizers, springs...)
  • heat treatments
  • fatigue damage analysis
  • weldings
  • lapping
  • coatings

X-Ray Diffraction (XRD)

Main Specification




Range Psi

from -45 to +45 deg

Range Phi

from 0 to 360 deg


solid state

Sample alignment

laser controlled


biaxial, stress tensor, sin2Psi method, elastic constants determinationc


cylindric; 1 mm, 2 mm, 3 mm; other diameters available



PDF document

File size: 1.93 MByte

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